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    ✅庄闲和✅㊣全球最大,最信誉的线上综合平台✅庄闲和✅千款游戏,砖石级服务,庄闲和,欢迎各界玩家加入体验!

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    Reduce the cost of test

    with SPEA Engineering Service

    SPEA, Your Single Vendor

    for Integrated Test Cell, Test Application Development, Production Start Up

     

    • increase your multi-site test capabilities
    • shorten the test time
    • optimize the development time
    • easily migrate your test applications from other test platform
    • reduce the cost of the test jig

     

     

    Our expert team, basing on 40+ years of experience, helps you develop the test solutions for your latest devices

     

    • Development, design and correlation of test project
    • Design for testability and test strategy consulting
    • Family test solution development
    • Test cell design
    • Test jig manufacturing
    • Factory integration

     

    We guide and support you during the device development, to help you get the best design for testability
    Complete support from installation
    to production start up

     

    • assistance for site preparation
    • system installation and factory integration
    • production start up and performance monitoring
    • yield optimization
    Speed up your time to market with SPEA Turnkey Application Development

    A team of SPEA test engineers develops your Test Application project, from the device specification analysis to the production start up. The entire working flow is focused on achieving the committed target in the shortest time, at the lowest cost, to speed up the product time to market.

    Awards

    SPEA test engineering team has been awarded for excellence, innovation, reliability and dramatic cost reduction. Several customers have been enabled to implement innovative solutions by cooperating with us, recognizing the differential value of our work.

    Test Application Skills

    Power Management ICs Test

    High multi site Power discrete module test

    Lighting ICs & LED drivers test

    Wafer and Final test of audio power amplifier

    Smart card RFID UHF test application

    Instrip Automotive Transceiver

    Tri-temp test inertial MEMS

    Car Radio

    Design & Code by dsweb.lab
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